新闻与活动
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LIGHTSpEED by UNiTYSC: The new high-end surface inspection solution for in-line monitoring and process qualification of opaque and transparent substrates
The LIGHTSpEED is the first unpatterned surface inspection solution that combines darkfield inspection and advanced synchronous doppler detection technology to capture nanometer scale defects on all kind of wafers. Grenoble, France – Tuesday, July 9th, 2019 – UnitySC,...
Unity-SC Demonstrates Its Unique Capability to Detect Non-scattering Potential Killer Defects on GaAs Substrates with Major VCSEL Manufacturer
Together with a key player in the VCSEL market, Unity-SC was able to improve their yield by sorting out wafers that presented defects only visible using the LIGHTsEE PSD™. If not detected, these defects can lead to failure later in the process or after system...
CEA-Leti and UnitySC Announce Further Development To Fuel Industry 4.0 with Smarter Tools
CEA-Leti and UnitySC Announce Further Development To Fuel Industry 4.0 with Smarter Tools SAN FRANCISCO – July 10, 2019 – Leti, a research institute of CEA Tech, and UnitySC, a wholly owned subsidiary of FOGALE Nanotech Group and a leader in inspection and metrology...
LETI Innovation Days
LETI Innovation Days DEEP TECH FOR EDGE ARTIFICIAL INTELLIGENCE Explore the power of distributed artificial intelligence, also called "Edge AI" during the Leti innovation Days on June 24-28, 2019 in Grenoble. Join to trigger the creative part of your brain and create...
13th International Conference on Nitride Semiconductors 2019 (July 7-12, 2019, Washington)
The 13th International Conference on Nitride Semiconductors 2019 will present high-impact scientific and technological advances in materials and devices based on group-III nitride semiconductors, and will feature plenary sessions, parallel topical sessions, poster...
IMAPS Conference in Boston (Sept 30- Oct 3)
During the 52th IMAPS conference held in Boston from the 30th of September until the 3rd of October, Unity Semiconductor will present a paper entitled : How to secure the fabrication of Gallium Nitride on Si wafers You can already read below an abstract of what we...
