由 kaiss.benhadjsalem@unity-sc.com | 9 月 16, 2019 | News, Press releases
Driven by automotive market growing, power devices are now requested to fulfill the Zero-Defect policy edicted by Power Device Manufacturers leading the market. Much more than adapting old technologies and equipment to this new challenge, specific solutions are...
由 kaiss.benhadjsalem@unity-sc.com | 7 月 25, 2019 | News, Press releases
The LIGHTSpEED is the first unpatterned surface inspection solution that combines darkfield inspection and advanced synchronous doppler detection technology to capture nanometer scale defects on all kind of wafers. Grenoble, France – Tuesday, July 9th, 2019 – UnitySC,...
由 kaiss.benhadjsalem@unity-sc.com | 7 月 25, 2019 | News, Press releases
Together with a key player in the VCSEL market, Unity-SC was able to improve their yield by sorting out wafers that presented defects only visible using the LIGHTsEE PSD™. If not detected, these defects can lead to failure later in the process or after system...
由 kaiss.benhadjsalem@unity-sc.com | 7 月 23, 2019 | News, Press releases
CEA-Leti and UnitySC Announce Further Development To Fuel Industry 4.0 with Smarter Tools SAN FRANCISCO – July 10, 2019 – Leti, a research institute of CEA Tech, and UnitySC, a wholly owned subsidiary of FOGALE Nanotech Group and a leader in inspection and metrology...
由 kaiss.benhadjsalem@unity-sc.com | 6 月 5, 2019 | Events, Press releases
During the 52th IMAPS conference held in Boston from the 30th of September until the 3rd of October, Unity Semiconductor will present a paper entitled : How to secure the fabrication of Gallium Nitride on Si wafers You can already read below an abstract of what we...
由 kaiss.benhadjsalem@unity-sc.com | 5 月 17, 2019 | Events, Press releases
Dr Carlos Beitia from CEA LETI has presented a paper about advanced metrology in collaboration with Unity during the Advanced Semiconductor Manufacturing Conference in New york. New York, 6th-9th May 2019- Surface nanotopography is important for different key advanced...
