Gilles Fresquet, CEO of UnitySC, mentionned in the article written by Francoise von Trapp from 3DInCites.
[…] UnitySC filled me in on their most recent inspection platform targeting heterogeneous integration, the 4See Series, an all-surface wafer inspection system designed as a completed solution for 2D and 3D optical and edge inspection. According to Unity’s Gilles Fresquet, it’s the only inspection platform that can be configured to inspect all around and through the wafer. The platform features a deflector module that uses phase shift deflectometry for wafer surface inspection, an edge and line-scan modules that rely on confocal chromatic technology […] [3DInCites]
