by kaiss.benhadjsalem@unity-sc.com | Jul 25, 2019 | News, Press releases
Together with a key player in the VCSEL market, Unity-SC was able to improve their yield by sorting out wafers that presented defects only visible using the LIGHTsEE PSD™. If not detected, these defects can lead to failure later in the process or after system...
by kaiss.benhadjsalem@unity-sc.com | Jul 23, 2019 | News, Press releases
CEA-Leti and UnitySC Announce Further Development To Fuel Industry 4.0 with Smarter Tools SAN FRANCISCO – July 10, 2019 – Leti, a research institute of CEA Tech, and UnitySC, a wholly owned subsidiary of FOGALE Nanotech Group and a leader in inspection and metrology...
by kaiss.benhadjsalem@unity-sc.com | May 21, 2019 | Asia, News
Unity SC is delighted to announce that the company has expended to open a new office in Singapore ! Singapore, the 15th May 2019 – Unity SC, a leading Metrology and Inspection company at the forefront of supporting the Global Semiconductor industry, has...
by kaiss.benhadjsalem@unity-sc.com | Apr 16, 2019 | News, Press releases
To see the complete article, you can download the magazine here : 3D InCities The First Decade Magazine The expected increase of power device markets — and more particularly insulated-gate bipolar transistor (IGBT) products for automotive and other applications — is...
by kaiss.benhadjsalem@unity-sc.com | Apr 3, 2018 | News
T-MAP 3D Time-domain Optical Coherence is the most robust solution for TSV depth, bow & warp and individual layer TTV of a stack measurement as each interface is detected in the right order over a larger range than spectral interferometry. The only limitation is...
by kaiss.benhadjsalem@unity-sc.com | Nov 22, 2017 | News
Article published in Silicon Semiconductor (Volume 39, Issue 4 2017) Thin and ultrathin ICs are in high demand, but yield that sacrifices reliability has little value. Inspection process control can be the solution, according to UnitySC. By Gilles Fresquet, CEO,...
